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核反応分析と深さ方向分析を通じて表面・界面層とバルク材料中の水素濃度の定量
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JoVE Journal Engineering
Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis
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核反応分析と深さ方向分析を通じて表面・界面層とバルク材料中の水素濃度の定量

日本語

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25,868 Views

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14:11 min

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March 29, 2016

DOI:

10.3791/53452-v

DOI:
10.3791/53452-v

•

14:11 min
March 29, 2016

•

17 Views
, , , ,
1Institute of Industrial Science,The University of Tokyo, 2Micro Analysis Laboratory, Tandem accelerator, The University Museum,The University of Tokyo

Summary

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我々は、定量的に表面上に、体積で、 ​​固体材料の界面層の水素原子の密度を評価するために、12 Cの共鳴核反応分析（NRA）（αγ、15 N）1 Hの適用を示します。パラジウムの表面近傍水素深さプロファイリング（110）単結晶およびSiO 2 / Siから（100）スタックに記載されています。

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Cite this Article

Wilde, M., Ohno, S., Ogura, S., Fukutani, K., Matsuzaki, H. Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis. J. Vis. Exp. (109), e53452, doi:10.3791/53452 (2016).

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