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Kwantificering van waterstof concentraties in Functionele Lagen en Bulk Materials door middel van diepte- met Nuclear Reaction Analysis
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JoVE Journal Engineering
Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis
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Kwantificering van waterstof concentraties in Functionele Lagen en Bulk Materials door middel van diepte- met Nuclear Reaction Analysis

Nederlands

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25,881 Views

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14:11 min

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March 29, 2016

DOI:

10.3791/53452-v

DOI:
10.3791/53452-v

•

14:11 min
March 29, 2016

•

17 Views
, , , ,
1Institute of Industrial Science,The University of Tokyo, 2Micro Analysis Laboratory, Tandem accelerator, The University Museum,The University of Tokyo

Summary

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We illustreren de toepassing van 1 H (15 N, αγ) 12 C resonante nucleaire reactie analyse (NRA) de dichtheid van waterstofatomen op het oppervlak kwantitatief evalueren, het volume, en een tussenlaag van vaste stoffen. Het nabije oppervlak waterstof diepteprofilering van een Pd (110) monokristal en SiO2 / Si (100) stapels beschreven.

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Cite this Article

Wilde, M., Ohno, S., Ogura, S., Fukutani, K., Matsuzaki, H. Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis. J. Vis. Exp. (109), e53452, doi:10.3791/53452 (2016).

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