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JoVE Journal Engineering
Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis
 

Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis

Article DOI: 10.3791/53452-v • 14:11 min • March 29th, 2016
March 29th, 2016 •
1, 1, 1, 1, 2
1Institute of Industrial Science, The University of Tokyo, 2Micro Analysis Laboratory, Tandem accelerator, The University Museum, The University of Tokyo

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Summary
Automatic Translation

We illustrate the application of 1H(15N,αγ)12C resonant nuclear reaction analysis (NRA) to quantitatively evaluate the density of hydrogen atoms on the surface, in the volume, and at an interfacial layer of solid materials. The near-surface hydrogen depth profiling of a Pd(110) single crystal and of SiO2/Si(100) stacks is described.

Tags

Quantification Hydrogen Concentrations Surface Layers Interface Layers Bulk Materials Depth Profiling Nuclear Reaction Analysis Resonant 15 NH Nuclear Reaction Absorbed Hydrogen Atoms Solid Surfaces Concentration Versus Depth Distribution Material Science Engineering Nondestructive Measurement Nanometer Depth Resolution Hydrogen Profiling Hydrogen Storage And Purification Materials Fuel Cell Catalysts Hydrogenation Catalysts Hydrogen Retention Embrittlement Device Fabrication Reliability Concerns Semi-conducted Technology Surface Science Instrumentation Atomically-controlled Target Surfaces Shallow Interfaces
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