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На месте SIMS и ИК спектроскопии Ну определенных поверхность, подготовленную мягкой посадки Масса выбранных ионов
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JoVE Journal Chemistry
In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions
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На месте SIMS и ИК спектроскопии Ну определенных поверхность, подготовленную мягкой посадки Масса выбранных ионов

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17,852 Views

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10:22 min

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June 16, 2014

DOI:

10.3791/51344-v

DOI:
10.3791/51344-v

•

10:22 min
June 16, 2014

•

4 Views
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1Physical Sciences Division,Pacific Northwest National Laboratory

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Johnson, G. E., Gunaratne, K. D. D., Laskin, J. In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions. J. Vis. Exp. (88), e51344, doi:10.3791/51344 (2014).

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