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その場 SIMSおよび質量選択されたイオンのソフトランディングで調製し明確に定義された表面の赤外分光法における
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JoVE Journal Chemistry
In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions
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その場 SIMSおよび質量選択されたイオンのソフトランディングで調製し明確に定義された表面の赤外分光法における

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17,852 Views

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10:22 min

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June 16, 2014

DOI:

10.3791/51344-v

DOI:
10.3791/51344-v

•

10:22 min
June 16, 2014

•

4 Views
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1Physical Sciences Division,Pacific Northwest National Laboratory

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Johnson, G. E., Gunaratne, K. D. D., Laskin, J. In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions. J. Vis. Exp. (88), e51344, doi:10.3791/51344 (2014).

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