需要订阅 JoVE 才能查看此. 登录或开始免费试用。
In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions
17,896 Views
•
10:22 min
•
June 16, 2014
DOI:
Summary
Automatically generated
Soft landing of mass-selected ions onto surfaces is a powerful approach for the highly-controlled preparation of novel materials. Coupled with analysis by in situ secondary ion mass spectrometry (SIMS) and infrared reflection absorption spectroscopy (IRRAS), soft landing provides unprecedented insights into the interactions of well-defined species with surfaces.
Explore More Videos
Read Article
Cite this Article
Johnson, G. E., Gunaratne, K. D. D., Laskin, J. In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions. J. Vis. Exp. (88), e51344, doi:10.3791/51344 (2014).
Copy