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April 26, 2014
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A reference interferometer technique, which is designed to remove undesirable laser jitter noise for nanodetection, is utilized for probing an ultra-high quality factor microcavity. Instructions for assembly, setup, and data acquisition are provided, alongside the measurement process for specifying the cavity quality factor.
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Vincent, S., Yu, W., Lu, T. Implementation of a Reference Interferometer for Nanodetection. J. Vis. Exp. (86), e51133, doi:10.3791/51133 (2014).
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