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초점을 맞춘 이온 빔은 밀링 및 뇌 조직의 전자 현미경을 스캐닝
JoVE Journal
Neuroscience
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JoVE Journal Neuroscience
Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue
Please note that all translations are automatically generated. Click here for the English version.

초점을 맞춘 이온 빔은 밀링 및 뇌 조직의 전자 현미경을 스캐닝

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27,573 Views

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08:57 min

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July 06, 2011

DOI:

10.3791/2588-v

DOI:
10.3791/2588-v

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08:57 min
July 06, 2011

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1 Views
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1Centre of interdisciplinary electron microscopy,École Polytechnique Fédérale de Lausanne

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Knott, G., Rosset, S., Cantoni, M. Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue. J. Vis. Exp. (53), e2588, doi:10.3791/2588 (2011).

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