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Haz de iones enfocado fresado y microscopía electrónica de barrido en el tejido cerebral

JoVE Journal
Neuroscience

This content is Free Access.

JoVE Journal Neuroscience

Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue

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Haz de iones enfocado fresado y microscopía electrónica de barrido en el tejido cerebral

27,573 Views

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08:57 min

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July 06, 2011

DOI:

DOI:

•

08:57 min

July 06, 2011

•

1 Views

Graham Knott, Stéphanie Rosset, Marco Cantoni

¹Centre of interdisciplinary electron microscopy,École Polytechnique Fédérale de Lausanne

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