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Vervoerder levensduur metingen in halfgeleiders via de magnetron Photoconductivity verval methode

JoVE Journal
Engenharia

This content is Free Access.

JoVE Journal Engenharia

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

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Vervoerder levensduur metingen in halfgeleiders via de magnetron Photoconductivity verval methode

26,723 Views

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07:38 min

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April 18, 2019

DOI:

10.3791/59007-v

DOI:

10.3791/59007-v

•

07:38 min

April 18, 2019

•

8 Views

Takato Asada, Yoshihito Ichikawa, Masashi Kato²

¹Department of Electrical & Mechanical Engineering,Nagoya Institute of Technology, ²Frontier Research Institute for Material Science,Nagoya Institute of Technology

Tags

Carrier Lifetime Semiconductor Microwave Photoconductivity Decay Micro-PCD 4H Silicon Carbide Aqueous Solution Pulsed Laser Photodiode Oscilloscope Microwave Waveguide Schottky Barrier Diode Gun Diode

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