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Probing C<sub> 84</sub> -embedded Si Substrat Utiliser Scanning Probe Microscopy and Molecular Dynamics

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Probing C₈₄-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

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Probing C<sub> 84</sub> -embedded Si Substrat Utiliser Scanning Probe Microscopy and Molecular Dynamics

11,533 Views

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13:58 min

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September 28, 2016

DOI:

10.3791/54235-v

DOI:

10.3791/54235-v

•

13:58 min

September 28, 2016

•

4 Views

Mon-Shu Ho, Chih-Pong Huang, Jyun-Hwei Tsai, Che-Fu Chou, Wen-Jay Lee

¹Department of Physics and Institute of Nanoscience,National Chung Hsing University, ²Metallurgy Section, Materials & Electro-Optics Research Division,National Chung-Shan Institute of Science and Technology, ³National Center for High-Performance Computing

Tags

C84-embedded Si Substrate Scanning Probe Microscopy Molecular Dynamics Nanomaterials Nanostructures Silicon (111) Substrate C84 Deposition Fullerene UHV-STM Heterojunction Electronic Properties Optoelectronic Properties Mechanical Properties Magnetic Properties Field Emission Properties

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