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13:58 min
September 28, 2016
DOI:
10.3791/54235-v
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Ho, M., Huang, C., Tsai, J., Chou, C., Lee, W. Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics. J. Vis. Exp. (115), e54235, doi:10.3791/54235 (2016).
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