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In Situ Transmission Electron Mikroskopi med biasing og fremstilling af asymmetriske overliggere baseret på blandet faset en-VOx
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In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx

In Situ Transmission Electron Mikroskopi med biasing og fremstilling af asymmetriske overliggere baseret på blandet faset en-VOx

3,835 Views

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09:49 min

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May 13, 2020

DOI:

10.3791/61026-v

DOI:
10.3791/61026-v

•

09:49 min
May 13, 2020

•

9 Views
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1Functional Materials and Microsystems Research Group and the Micro Nano Research Facility,RMIT University, 2RMIT Microscopy and Microanalysis Facility,RMIT University

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In-situ Transmission Electron MicroscopyBiasingCrossbar DevicesAmorphous Vanadium OxideNano-structural ChangesMetal-insulator-metal DevicePhotolithographyPhysical Vapor DepositionLift-offBiasing ChipGridbar

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Nirantar, S., Mayes, E., Sriram, S. In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx. J. Vis. Exp. (159), e61026, doi:10.3791/61026 (2020).

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