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基于混合相位a-VOx的不对称横杆的偏置和制造现场传输电子显微镜
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In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
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基于混合相位a-VOx的不对称横杆的偏置和制造现场传输电子显微镜

3,852 Views

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09:49 min

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May 13, 2020

DOI:

10.3791/61026-v

DOI:
10.3791/61026-v

•

09:49 min
May 13, 2020

•

12 Views
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1Functional Materials and Microsystems Research Group and the Micro Nano Research Facility,RMIT University, 2RMIT Microscopy and Microanalysis Facility,RMIT University

Summary

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这里介绍了一个协议，用于分析纳米结构的变化，在原位偏置与传输电子显微镜 （TEM） 堆叠金属绝缘体金属结构。它在下一代可编程逻辑电路和神经微敏硬件的电阻开关横杆中具有显著应用，可揭示其基本操作机制和实际适用性。

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Nirantar, S., Mayes, E., Sriram, S. In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx. J. Vis. Exp. (159), e61026, doi:10.3791/61026 (2020).

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