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High-resolution Single Particle Analysis from Electron Cryo-microscopy Images Using SPHIRE
JoVE 신문
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High-resolution Single Particle Analysis from Electron Cryo-microscopy Images Using SPHIRE

High-resolution Single Particle Analysis from Electron Cryo-microscopy Images Using SPHIRE

DOI:

13:28 min

May 16, 2017

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Chapters

  • 00:05Title
  • 01:16Micrograph Alignment and Particle Picking
  • 03:482D Classification and Initial 3D Modeling
  • 05:513D Model-refinement
  • 07:533D Sorting and Local Resolution Estimation
  • 10:46Results: High-resolution 3D Modeling of TcdA1
  • 12:19Conclusion

Summary

자동 번역

This paper presents a protocol for processing cryo-EM images using the software suite SPHIRE. The present protocol can be applied for nearly all single particle EM projects that target near-atomic resolution.

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