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マイクロ波光伝導減衰法による半導体中のキャリア ライフ タイム測定
JoVE Journal
Ingegneria
This content is Free Access.
JoVE Journal Ingegneria
Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
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マイクロ波光伝導減衰法による半導体中のキャリア ライフ タイム測定

27,063 Views

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07:38 min

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April 18, 2019

DOI:

10.3791/59007-v

DOI:
10.3791/59007-v

•

07:38 min
April 18, 2019

•

61 Views
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1Department of Electrical & Mechanical Engineering,Nagoya Institute of Technology, 2Frontier Research Institute for Material Science,Nagoya Institute of Technology

Summary

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半導体の重要な物理パラメーターのひとつとして、キャリアの寿命をマイクロ波光伝導減衰法を用いたプロトコル経由で本測定します。

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Cite this Article

Asada, T., Ichikawa, Y., Kato, M. Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method. J. Vis. Exp. (146), e59007, doi:10.3791/59007 (2019).

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