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微波导光衰减法测量半导体中的载波寿命

Journal JoVE
Ingénierie

This content is Free Access.

Journal JoVE Ingénierie

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

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微波导光衰减法测量半导体中的载波寿命

26,991 Views

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07:38 min

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April 18, 2019

DOI:

10.3791/59007-v

DOI:

10.3791/59007-v

•

07:38 min

April 18, 2019

•

61 Views

Takato Asada¹, Yoshihito Ichikawa¹, Masashi Kato^1,2

¹Department of Electrical & Mechanical Engineering,Nagoya Institute of Technology, ²Frontier Research Institute for Material Science,Nagoya Institute of Technology

Summary

作为半导体中重要的物理参数之一, 本文采用微波光导性衰减法的协议对载流子寿命进行了测量。

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