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Carrier livstid mätningar i halvledare via metoden mikrovågsugn Photoconductivity förfall

JoVE Revista
Ingeniería

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JoVE Revista Ingeniería

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

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Carrier livstid mätningar i halvledare via metoden mikrovågsugn Photoconductivity förfall

26,723 Views

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07:38 min

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April 18, 2019

DOI:

10.3791/59007-v

DOI:

10.3791/59007-v

•

07:38 min

April 18, 2019

•

8 Views

Takato Asada, Yoshihito Ichikawa, Masashi Kato²

¹Department of Electrical & Mechanical Engineering,Nagoya Institute of Technology, ²Frontier Research Institute for Material Science,Nagoya Institute of Technology

Tags

Carrier Lifetime Semiconductor Microwave Photoconductivity Decay Micro-PCD 4H Silicon Carbide Aqueous Solution Pulsed Laser Photodiode Oscilloscope Microwave Waveguide Schottky Barrier Diode Gun Diode

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