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Characterizing Spherulites with Polarization-Sensitive Two-Photon Microscopy
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מיקרוסקופ שני פוטונים רגיש לקיטוב לאפיון מבני עמילואיד ללא תוויות
JoVE Journal
Chemistry
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JoVE Journal Chemistry
Polarization-Sensitive Two-Photon Microscopy for a Label-Free Amyloid Structural Characterization
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מיקרוסקופ שני פוטונים רגיש לקיטוב לאפיון מבני עמילואיד ללא תוויות

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565 Views

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01:31 min

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September 08, 2023

DOI:

10.3791/65670-v

DOI:
10.3791/65670-v

•

01:31 min
September 08, 2023

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3 Views
, ,
1Institute of Advanced Materials,Wrocław University of Science and Technology

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Cite this Article

Lipok, M., Obstarczyk, P., Olesiak-Bańska, J. Polarization-Sensitive Two-Photon Microscopy for a Label-Free Amyloid Structural Characterization. J. Vis. Exp. (199), e65670, doi:10.3791/65670 (2023).

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