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Polarisatiegevoelige twee-fotonmicroscopie voor een labelvrije structurele karakterisering van amyloïden

JoVE Journal
Chemistry
Author Produced

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JoVE Journal Chemistry

Polarization-Sensitive Two-Photon Microscopy for a Label-Free Amyloid Structural Characterization

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Polarisatiegevoelige twee-fotonmicroscopie voor een labelvrije structurele karakterisering van amyloïden

565 Views

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01:31 min

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September 08, 2023

DOI:

10.3791/65670-v

DOI:

10.3791/65670-v

•

01:31 min

September 08, 2023

•

3 Views

Maciej Lipok¹, Patryk Obstarczyk¹, Joanna Olesiak-Bańska¹

¹Institute of Advanced Materials,Wrocław University of Science and Technology

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