Journal
/
Biology
/
Préparation d’échantillons par fraisage par faisceau d’ions focalisé corrélatif 3D pour la cryotomographie électronique haute résolution
JoVE Journal
Biology
This content is Free Access.
JoVE Journal Biology
Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography
Please note that all translations are automatically generated. Click here for the English version.

Préparation d’échantillons par fraisage par faisceau d’ions focalisé corrélatif 3D pour la cryotomographie électronique haute résolution

français

Automatically Generated

2,783 Views

•

08:20 min

•

October 25, 2021

DOI:

10.3791/62886-v

DOI:
10.3791/62886-v

•

08:20 min
October 25, 2021

•

5 Views
, , , ,
1Max Planck Institute of Biochemistry, 2Max Planck Institute for Biophysics, 3Fondazione Human Technopole

Explore More Videos

3D-correlative FIB MillingCryo-electron TomographyCryo-fluorescence MicroscopyCryo-FIB-SEMSEM Grid OverviewFLM-SEM CorrelationIon Beam ImagingCellular Ultrastructure

Read Article

Cite this Article

Bieber, A., Capitanio, C., Wilfling, F., Plitzko, J., Erdmann, P. S. Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography. J. Vis. Exp. (176), e62886, doi:10.3791/62886 (2021).

Download .ris file

Copy

Share Video

.

Copy