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07:24 min
May 10, 2021
DOI:
10.3791/62015-v
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Ohtsuka, M., Muto, S. Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis. J. Vis. Exp. (171), e62015, doi:10.3791/62015 (2021).
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