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ToF-SIMSおよびXPS分析用ナノ粒子の調製
JoVE Journal
Chemistry
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JoVE Journal Chemistry
Preparation of Nanoparticles for ToF-SIMS and XPS Analysis
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ToF-SIMSおよびXPS分析用ナノ粒子の調製

日本語

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7,053 Views

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06:24 min

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September 13, 2020

DOI:

10.3791/61758-v

DOI:
10.3791/61758-v

•

06:24 min
September 13, 2020

•

44 Views
, , , , , , ,
1Division of Surface Analysis and Interfacial Chemistry,Federal Institute for Material Research and Testing (BAM), 2Department of Chemical and Product Safety,German Federal Institute for Risk Assessment (BfR)

Summary

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表面分析用のナノ粒子を調製するための多くの異なる手順(ドロップキャスティング、スピンコーティング、粉末からの堆積、およびcryofixation)が提示されています。各方法の課題、機会、応用例、特に様々な調製方法による表面特性の変化について議論する。

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Cite this Article

Bennet, F., Müller, A., Radnik, J., Hachenberger, Y., Jungnickel, H., Laux, P., Luch, A., Tentschert, J. Preparation of Nanoparticles for ToF-SIMS and XPS Analysis. J. Vis. Exp. (163), e61758, doi:10.3791/61758 (2020).

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