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用于ToF-SIMS和XPS分析的纳米颗粒的制备
JoVE Journal
Chemistry
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JoVE Journal Chemistry
Preparation of Nanoparticles for ToF-SIMS and XPS Analysis
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用于ToF-SIMS和XPS分析的纳米颗粒的制备

English

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6,915 Views

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06:24 min

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September 13, 2020

DOI:

10.3791/61758-v

DOI:
10.3791/61758-v

•

06:24 min
September 13, 2020

•

44 Views
, , , , , , ,
1Division of Surface Analysis and Interfacial Chemistry,Federal Institute for Material Research and Testing (BAM), 2Department of Chemical and Product Safety,German Federal Institute for Risk Assessment (BfR)

Summary

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介绍了制备用于表面分析的纳米颗粒的多种不同程序（滴铸，旋涂，粉末沉积和冷冻固定）。我们讨论了每种方法的挑战，机遇和可能的应用，特别是关于不同制备方法引起的表面性能变化。

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Cite this Article

Bennet, F., Müller, A., Radnik, J., Hachenberger, Y., Jungnickel, H., Laux, P., Luch, A., Tentschert, J. Preparation of Nanoparticles for ToF-SIMS and XPS Analysis. J. Vis. Exp. (163), e61758, doi:10.3791/61758 (2020).

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