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Chapters
- 00:00Title
- 02:51Selecting and Designing Optimum Structure
- 03:31Modeling and Fabrication on CMOS
- 05:39Device Testing: Thermal Camera Test for Embedded Heaters
- 06:27Device Testing: Calibrating LDV and Test Setup
- 09:19Device Testing: Testing 68μm Long MEMS Filters via LDV
- 10:32Device Testing: Higher Mode Measurement
- 11:01Avoiding Device Failures
- 11:45Avoiding Failures: High Thermal Stress and Burning
- 12:10Boosting The Tuning Capability
- 13:16Results
- 14:07Conclusion
