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L'applicazione di X-ray Imaging cristallo Spettroscopia per l'uso come ad alta temperatura del plasma di diagnostica

JoVE Journal
Engineering

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JoVE Journal Engineering

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic

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L'applicazione di X-ray Imaging cristallo Spettroscopia per l'uso come ad alta temperatura del plasma di diagnostica

11,158 Views

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06:46 min

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August 25, 2016

DOI:

10.3791/54408-v

DOI:

10.3791/54408-v

•

06:46 min

August 25, 2016

•

5 Views

Norman M. Cao, Andrés M. Mier Valdivia, John E. Rice

¹Department of Nuclear Science and Engineering,Massachusetts Institute of Technology, ²Department of Physics,Massachusetts Institute of Technology, ³Plasma Science and Fusion Center,Massachusetts Institute of Technology

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