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Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
JoVE 杂志
工程学
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JoVE 杂志 工程学
Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic

DOI:
10.3791/54408-v

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06:46 min

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August 25, 2016

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, ,
1Department of Nuclear Science and Engineering,Massachusetts Institute of Technology, 2Department of Physics,Massachusetts Institute of Technology, 3Plasma Science and Fusion Center,Massachusetts Institute of Technology

Chapters

  • 00:05Title
  • 00:53Mounting the High Resolution X-ray Crystal Imaging Spectrometer with Spatial Resolution (HIREXSR) Hardware
  • 04:12Results: Inverted Plasma Temperature and Torodial Velocity Profiles from Argon Helium-like Spectra
  • 05:38Conclusion

Summary

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X-ray spectra provide a wealth of information on high temperature plasmas. This manuscript presents the operation of a high wavelength resolution spatially imaging X-ray spectrometer used to view hydrogen- and helium-like ions of medium atomic number elements in a tokamak plasma.

Tags

X-ray ImagingCrystal SpectroscopyPlasma DiagnosticsFusion PlasmaIon TemperatureRotation VelocityElectron TemperatureImpurity DensityTransport ModelingHIREXSRLaser Blow-offTokamak Plasma

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