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Hoekopgeloste foto-emissie spectroscopie bij ultralage temperaturen
JoVE Journal
Engineering
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JoVE Journal Engineering
Angle-resolved Photoemission Spectroscopy At Ultra-low Temperatures
DOI:

08:53 min

October 09, 2012

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Chapters

  • 00:05Title
  • 02:18Mounting the Sample
  • 03:01Achieving Ultra-high Vacuum and Thermal Isolation
  • 04:02Positioning and Cooling the Sample
  • 04:55Collecting Data
  • 05:30Results: High Resolution Electronic Structure of Crystals
  • 07:23Conclusion

Summary

Automatic Translation

Het algemene doel van deze methode is het bepalen van de lage-energie elektronische structuur van vaste stoffen bij ultralage temperaturen met behulp van hoekopgeloste foto-emissie spectroscopie met synchrotron straling.

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