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通过冷冻聚焦离子束铣削与扫描电子显微镜和光谱学耦合，对液固界面进行纳米级表征
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Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy
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通过冷冻聚焦离子束铣削与扫描电子显微镜和光谱学耦合，对液固界面进行纳米级表征

DOI:
10.3791/61955-v

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11:03 min

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July 14, 2022

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, ,
1School of Applied and Engineering Physics,Cornell University, 2Kavli Institute at Cornell for Nanoscale Science

Capítulos

  • 00:04Introduction
  • 00:29Scanning Electron Microscope (SEM) and Cryogenic Station Preparation
  • 01:31Sample Vitrification
  • 02:51Sample Surface Imaging and Feature Location
  • 04:19Cross-Section Preparation
  • 06:52Energy Dispersive X-Ray (EDX) Mapping
  • 08:12Results: Representative Nanoscale Liquid-Solid Interface Characterization
  • 10:24Conclusion

Summary

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Tadução automática

低温聚焦离子束（FIB）和扫描电子显微镜（SEM）技术可以为完整固液界面的化学和形态提供关键见解。详细介绍了制备此类界面的高质量能量色散X射线（EDX）光谱图的方法，重点是储能器件。

Tags

Cryo-SEMFIBLiquid-solid InterfacesBiological SamplesSample PreparationCryogenic CoolingVitrificationScanning Electron MicroscopySpectroscopyNanoscale Characterization

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