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Gericht Ion Beam Frezen en Scanning Electron Microscopy van hersenweefsel
JoVE Journal
Neurociência
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JoVE Journal Neurociência
Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue
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Gericht Ion Beam Frezen en Scanning Electron Microscopy van hersenweefsel

27,643 Views

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08:57 min

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July 06, 2011

DOI:

10.3791/2588-v

DOI:
10.3791/2588-v

•

08:57 min
July 06, 2011

•

3 Views
, ,
1Centre of interdisciplinary electron microscopy,École Polytechnique Fédérale de Lausanne

Summary

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Dit protocol beschrijft hoe hars ingebed hersenweefsel kan worden voorbereid en afgebeeld in de drie dimensies in de gerichte ion beam, scanning electronen microscoop.

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Cite this Article

Knott, G., Rosset, S., Cantoni, M. Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue. J. Vis. Exp. (53), e2588, doi:10.3791/2588 (2011).

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