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01:31 min
September 08, 2023
DOI:
10.3791/65670-v
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Lipok, M., Obstarczyk, P., Olesiak-Bańska, J. Polarization-Sensitive Two-Photon Microscopy for a Label-Free Amyloid Structural Characterization. J. Vis. Exp. (199), e65670, doi:10.3791/65670 (2023).
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