Journal
/
생물학
/
Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography
JoVE 신문
생물학
This content is Free Access.
JoVE 신문 생물학
Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography

Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography

2,780 Views

•

08:20 min

•

October 25, 2021

DOI:

10.3791/62886-v

DOI:
10.3791/62886-v

•

08:20 min
October 25, 2021

•

5 Views
, , , ,
1Max Planck Institute of Biochemistry, 2Max Planck Institute for Biophysics, 3Fondazione Human Technopole

Explore More Videos

3D-correlative FIB MillingCryo-electron TomographyCryo-fluorescence MicroscopyCryo-FIB-SEMSEM Grid OverviewFLM-SEM CorrelationIon Beam ImagingCellular Ultrastructure

Read Article

Cite this Article

Bieber, A., Capitanio, C., Wilfling, F., Plitzko, J., Erdmann, P. S. Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography. J. Vis. Exp. (176), e62886, doi:10.3791/62886 (2021).

Download .ris file

Copy

Share Video

.

Copy