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Preparation of Nanoparticles for ToF-SIMS and XPS Analysis
JoVE Journal
Chemistry
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JoVE Journal Chemistry
Preparation of Nanoparticles for ToF-SIMS and XPS Analysis

Preparation of Nanoparticles for ToF-SIMS and XPS Analysis

English

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7,052 Views

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06:24 min

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September 13, 2020

DOI:

10.3791/61758-v

DOI:
10.3791/61758-v

•

06:24 min
September 13, 2020

•

44 Views
, , , , , , ,
1Division of Surface Analysis and Interfacial Chemistry,Federal Institute for Material Research and Testing (BAM), 2Department of Chemical and Product Safety,German Federal Institute for Risk Assessment (BfR)

Summary

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A number of different procedures for preparing nanoparticles for surface analysis are presented (drop casting, spin coating, deposition from powders, and cryofixation). We discuss the challenges, opportunities, and possible applications of each method, particularly regarding the changes in the surface properties caused by the different preparation methods.

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Cite this Article

Bennet, F., Müller, A., Radnik, J., Hachenberger, Y., Jungnickel, H., Laux, P., Luch, A., Tentschert, J. Preparation of Nanoparticles for ToF-SIMS and XPS Analysis. J. Vis. Exp. (163), e61758, doi:10.3791/61758 (2020).

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