ジャーナル
/
化学
/
Synthesis of Low-Valent MOFs from Multitopic Phosphine Linkers
/
Characterization of the MOF Product by Powder X-Ray Diffraction (PXRD)
JoVE Journal
化学
このコンテンツを視聴するには、JoVE 購読が必要です。  サインイン又は無料トライアルを申し込む。
JoVE Journal 化学
Characterization of the MOF Product by Powder X-Ray Diffraction (PXRD)

Characterization of the MOF Product by Powder X-Ray Diffraction (PXRD)

568 Views

•

01:16 min

•

May 12, 2023

DOI:

10.3791/200129-v

DOI:
10.3791/200129-v

•

01:16 min
May 12, 2023

•

10 Views
, ,
1Department of Chemistry and Biochemistry,University of California, San Diego

Explore More Videos

MOFPowder X-ray DiffractionPXRDSilicon Sample Holder2-thetaSimulated Powder PatternExperimental PXRD PatternTin-palladium Low-valent MOFAmorphous SampleTriphenylphosphine ModulatorCrystalline Material

Read Article

Cite this Article

Griffin, S. E., Domecus, G. P., Cohen, S. M. Characterization of the MOF Product by Powder X-Ray Diffraction (PXRD). J. Vis. Exp. (Pending Publication), e200129, doi:10.3791/200129 (2023).

Download .ris file

Copy

Share Video

.

Copy