Journal
/
Quimica
/
Synthesis of Low-Valent MOFs from Multitopic Phosphine Linkers
/
Characterization of the MOF Product by Powder X-Ray Diffraction (PXRD)
JoVE Revista
Quimica
Se requiere una suscripción a JoVE para ver este contenido.  Inicie sesión o comience su prueba gratuita.
JoVE Revista Quimica
Characterization of the MOF Product by Powder X-Ray Diffraction (PXRD)

Characterization of the MOF Product by Powder X-Ray Diffraction (PXRD)

568 Views

•

01:16 min

•

May 12, 2023

DOI:

10.3791/200129-v

DOI:
10.3791/200129-v

•

01:16 min
May 12, 2023

•

10 Views
, ,
1Department of Chemistry and Biochemistry,University of California, San Diego

Explore More Videos

MOFPowder X-ray DiffractionPXRDSilicon Sample Holder2-thetaSimulated Powder PatternExperimental PXRD PatternTin-palladium Low-valent MOFAmorphous SampleTriphenylphosphine ModulatorCrystalline Material

Read Article

Cite this Article

Griffin, S. E., Domecus, G. P., Cohen, S. M. Characterization of the MOF Product by Powder X-Ray Diffraction (PXRD). J. Vis. Exp. (Pending Publication), e200129, doi:10.3791/200129 (2023).

Download .ris file

Copy

Share Video

.

Copy