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使用 25Mg + 荧光对真空窗双参考进行 原点测量
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In Situ Measurement of Vacuum Window Birefringence using 25Mg+ Fluorescence
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使用 25Mg + 荧光对真空窗双参考进行 原点测量

DOI:
10.3791/61175-v

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07:03 min

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June 13, 2020

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, , , , , , , ,
1MOE Key Laboratory of Fundamental Physical Quantities Measurement, Hubei Key Laboratory of Gravitation and Quantum Physics, PGMF and School of Physics,Huazhong University of Science and Technology

Capitoli

  • 00:04Introduction
  • 01:06A and B Polarizer Reference Direction Setup
  • 02:00Waveplate Azimuthal Angles Reference Angle Setup
  • 02:51Single 25Mg+ Ion Doppler Cooling
  • 03:30Doppler Cooling Laser Frequency Wavelength Meter Locking
  • 04:01Laser Intensity Setup
  • 04:33Vacuum Window Birefringence Measurement
  • 04:59Results: Representative Vacuum Window Birefringence Analyses
  • 06:08Conclusion

Summary

Traduzione automatica

Traduzione automatica

此处介绍的是一种测量真空窗的双反数的方法，方法是最大化多普勒在离子陷阱中冷却 25Mg + 离子发出的 荧光计数。真空窗的双反光将改变激光的极化状态，通过改变外波板的分角可以补偿。

Tags

In-situ MeasurementVacuum Window Birefringence25Mg+ FluorescencePolarization CompensationCold AtomsIon TrapDoppler CoolingMagnesium-25 IonsPolarizerWave PlateLaser BeamVacuum Chamber

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