Journal
/
Engenharia
/
In Situ Measurement of Vacuum Window Birefringence using 25Mg+ Fluorescence
JoVE Journal
Engenharia
É necessária uma assinatura da JoVE para visualizar este conteúdo.  Faça login ou comece sua avaliação gratuita.
JoVE Journal Engenharia
In Situ Measurement of Vacuum Window Birefringence using 25Mg+ Fluorescence

In Situ Measurement of Vacuum Window Birefringence using 25Mg+ Fluorescence

DOI:
10.3791/61175-v

•

07:03 min

•

June 13, 2020

•

, , , , , , , ,
1MOE Key Laboratory of Fundamental Physical Quantities Measurement, Hubei Key Laboratory of Gravitation and Quantum Physics, PGMF and School of Physics,Huazhong University of Science and Technology

Capítulos

  • 00:04Introduction
  • 01:06A and B Polarizer Reference Direction Setup
  • 02:00Waveplate Azimuthal Angles Reference Angle Setup
  • 02:51Single 25Mg+ Ion Doppler Cooling
  • 03:30Doppler Cooling Laser Frequency Wavelength Meter Locking
  • 04:01Laser Intensity Setup
  • 04:33Vacuum Window Birefringence Measurement
  • 04:59Results: Representative Vacuum Window Birefringence Analyses
  • 06:08Conclusion

Summary

Tadução automática

Tadução automática

Presented here is a method to measure the birefringence of vacuum windows by maximizing the fluorescence counts emitted by Doppler cooled 25Mg+ ions in an ion trap. The birefringence of vacuum windows will change the polarization states of the laser, which can be compensated by changing the azimuthal angles of external wave plates.

Tags

In-situ MeasurementVacuum Window Birefringence25Mg+ FluorescencePolarization CompensationCold AtomsIon TrapDoppler CoolingMagnesium-25 IonsPolarizerWave PlateLaser BeamVacuum Chamber

Article

Embed

ADICIONAR À PLAYLIST

Usage Statistics

Vídeos Relacionados

Measurement of Coherence Decay in GaMnAs Using Femtosecond Four-wave Mixing

In Situ Neutron Powder Diffraction Using Custom-made Lithium-ion Batteries

Development of an Experimental Setup for the Measurement of the Coefficient of Restitution under Vacuum Conditions

Seedless Growth of Bismuth Nanowire Array via Vacuum Thermal Evaporation

Optical Trap Loading of Dielectric Microparticles In Air

Production and Characterization of Vacuum Deposited Organic Light Emitting Diodes

Methods of Ex Situ and In Situ Investigations of Structural Transformations: The Case of Crystallization of Metallic Glasses

Method Development for Contactless Resonant Cavity Dielectric Spectroscopic Studies of Cellulosic Paper

In Situ Surface Temperature Measurement in a Conveyor Belt Furnace via Inline Infrared Thermography

Measuring Sub-23 Nanometer Real Driving Particle Number Emissions Using the Portable DownToTen Sampling System

Read Article