/

/

Ion Beam concentrato di fresatura e Microscopia Elettronica a Scansione di tessuto cerebrale

JoVE Journal
Neuroscienze

This content is Free Access.

JoVE Journal Neuroscienze

Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue

Please note that all translations are automatically generated. Click here for the English version.

Ion Beam concentrato di fresatura e Microscopia Elettronica a Scansione di tessuto cerebrale

27,565 Views

•

08:57 min

•

July 06, 2011

DOI:

DOI:

•

08:57 min

July 06, 2011

•

1 Views

Graham Knott, Stéphanie Rosset, Marco Cantoni

¹Centre of interdisciplinary electron microscopy,École Polytechnique Fédérale de Lausanne

Tags

Focussed Ion Beam Milling Scanning Electron Microscopy FIB/SEM Protocol Aldehydes Fixation Heavy Metal Staining Osmium Tetroxide Uranyl Acetate Dehydration Resin Infiltration Ultramicrotome Glass Knives Block Preparation Vertical Face Milling Backscattered Electron Imaging Serial Imaging Isotropic Voxels Cell Ultrastructure Analysis

Read Article