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Odaklı İyon Işın Freze ve Beyin Dokusu Taramalı Elektron Mikroskobu
JoVE Journal
Neuroscienze
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JoVE Journal Neuroscienze
Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue
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Odaklı İyon Işın Freze ve Beyin Dokusu Taramalı Elektron Mikroskobu

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08:57 min

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July 06, 2011

DOI:

10.3791/2588-v

DOI:
10.3791/2588-v

•

08:57 min
July 06, 2011

•

3 Views
, ,
1Centre of interdisciplinary electron microscopy,École Polytechnique Fédérale de Lausanne

Summary

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Bu protokol, taramalı elektron mikroskobu, reçine gömülü beyin dokusu, odaklanmış iyon demeti üç boyutlu olarak hazırlanmış ve yansıması nasıl açıklamaktadır.

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Cite this Article

Knott, G., Rosset, S., Cantoni, M. Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue. J. Vis. Exp. (53), e2588, doi:10.3791/2588 (2011).

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