Journal
/
Ingénierie
/
Performing In Situ Closed-Cell Gas Reactions in the Transmission Electron Microscope
Journal JoVE
Ingénierie
Author Produced
Un abonnement à JoVE est nécessaire pour voir ce contenu.  Connectez-vous ou commencez votre essai gratuit.
Journal JoVE Ingénierie
Performing In Situ Closed-Cell Gas Reactions in the Transmission Electron Microscope

Performing In Situ Closed-Cell Gas Reactions in the Transmission Electron Microscope

DOI:
10.3791/62174-v

•

14:21 min

•

July 24, 2021

•

, , , , , , ,
1Center for Nanophase Materials Sciences,Oak Ridge National Laboratory, 2Protochips Inc., 3Department of Materials Science & Engineering,University of Michigan, 4Catalytic Carbon Transformation & Scale-up,National Renewable Energy Laboratory, 5Materials Science & Technology Division,Oak Ridge National Laboratory

Chapitres

  • 00:00Introduction
  • 01:40E-chip Preparation
  • 05:10Preparation of the CCGR-TEM Holder
  • 06:23Preparation of Experimental Setup
  • 07:59Residual Gas Analyzer (RGA) System
  • 10:52Running the Reaction
  • 12:46Representative Results
  • 13:29Summary

Summary

Traduction automatique

Traduction automatique

Here, we present a protocol for performing in situ TEM closed-cell gas reaction experiments while detailing several commonly used sample preparation methods.

Tags

In SituClosed-cell Gas ReactionCCGRScanning Transmission Electron MicroscopyCatalystsStructural MaterialsCarbon NanotubesReal-time AnalysisElevated TemperatureAtmospheric PressureSample PreparationPowder DepositionColloidal SuspensionE-chipMask

Article

Embed

AJOUTER À LA PLAYLIST

Usage Statistics

Vidéos Connexes

Revealing Dynamic Processes of Materials in Liquids Using Liquid Cell Transmission Electron Microscopy

In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Studying Dynamic Processes of Nano-sized Objects in Liquid using Scanning Transmission Electron Microscopy

A Method for Obtaining Serial Ultrathin Sections of Microorganisms in Transmission Electron Microscopy

Methods of Ex Situ and In Situ Investigations of Structural Transformations: The Case of Crystallization of Metallic Glasses

Scalable Quantum Integrated Circuits on Superconducting Two-Dimensional Electron Gas Platform

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope

In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx

Read Article