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Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
Journal JoVE
Ingénierie
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Journal JoVE Ingénierie
Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction

DOI:
10.3791/55506-v

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09:13 min

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April 01, 2017

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, , ,
1School of Civil Engineering,The University of Sydney, 2Australian Centre for Microscopy and Microanalysis,The University of Sydney, 3Department of Earth and Planetary Sciences,Macquarie University, 4Charles Delaunay Institute, LASMIS, UMR STMR CNRS 6281,University of Technology of Troyes

Chapitres

  • 00:05Titre
  • 00:46Equipment and Sample Requirements and Experimental Set-up
  • 04:11EBSD Software Parameters for Data Acquisition
  • 06:36Results: Characterization of Ultra-fine Grained and Nanocrystalline Microstructures by Transmission Kikuchi Diffraction
  • 08:33Conclusion

Summary

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This paper provides a detailed method to characterize the microstructure of ultra-fine grained and nanocrystalline materials using a scanning electron microscope equipped with a standard electron backscatter diffraction system. Metal alloys and minerals presenting refined microstructures are analyzed using this technique, showing the diversity of its possible applications.

Tags

Transmission Kikuchi DiffractionMicrostructureCrystalline MaterialsSubmicron Size GrainsSevere Plastic DeformationScanning Electron MicroscopeEBSD DetectorSample PreparationAccelerating VoltageApertureHigh Current ModeWorking DistanceEBSD SoftwareEBSD Camera

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