Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue

Graham Knott; St&#233;phanie Rosset; Marco Cantoni

doi:10.3791/2588

Journal

/

Neurosciences

/

Gericht Ion Beam Frezen en Scanning Electron Microscopy van hersenweefsel

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Neurosciences

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Journal JoVE Neurosciences

Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue

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Gericht Ion Beam Frezen en Scanning Electron Microscopy van hersenweefsel

27,646 Views

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08:57 min

•

July 06, 2011

DOI:

10.3791/2588-v

DOI:

10.3791/2588-v

•

08:57 min

July 06, 2011

•

3 Views

Graham Knott¹, Stéphanie Rosset¹, Marco Cantoni¹

¹Centre of interdisciplinary electron microscopy,École Polytechnique Fédérale de Lausanne

Summary

Dit protocol beschrijft hoe hars ingebed hersenweefsel kan worden voorbereid en afgebeeld in de drie dimensies in de gerichte ion beam, scanning electronen microscoop.

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Gericht Ion Beam Frezen en Scanning Electron Microscopy van hersenweefsel

Summary

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