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Journal / Genetics / Pre-Implantation Genetic Testing for Aneuploidy…
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Genetics

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JoVE Journal Genetics
Pre-Implantation Genetic Testing for Aneuploidy on a Semiconductor Based Next-Generation Sequencing Platform
 

Pre-Implantation Genetic Testing for Aneuploidy on a Semiconductor Based Next-Generation Sequencing Platform

Article DOI: 10.3791/63493-v • 09:30 min • August 17th, 2022
August 17th, 2022 •
*1, *2, 1, 1, 3, 4, 5, 1, 1, 1, 2, 2, 1
1Centre for Women, Children, and Reproduction, Guangxi Key Laboratory of Metabolic Diseases Research, 2Department of Biopharmaceutics, School of Laboratory Medicine and Biotechnology, Southern Medical University, 3Department of Obstetrics and Gynecology, Chinese PLA General Hospital, 4Clinical Laboratory, Northern Theater Air Force Hospital, 5Guangzhou Darui Reproduction Technology Co., Ltd.
* These authors contributed equally

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Summary
Automatic Translation

The protocol presents the overall in-lab procedures required in pre-implantation genetic testing for aneuploidy on a semiconductor-based next-generation sequencing platform. Here we present the detailed steps of whole genome amplification, DNA fragment selection, library construction, template preparation, and sequencing working flow with representative results.

Tags

Pre-Implantation Genetic Testing Aneuploidy Semiconductor Based Next-Generation Sequencing Platform Single Cell Amplification Final Reporting Data Experimental Workflow PGT-A Sequencing Diagnostic Laboratory NGS Platform Whole Genome Amplification Products DNA Purification Beads DNA Binding Process Magnetic Beads
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