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全电子纳秒分辨扫描隧道显微镜: 促进单一掺杂剂电荷动力学的研究

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工程学

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JoVE 杂志工程学

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

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全电子纳秒分辨扫描隧道显微镜: 促进单一掺杂剂电荷动力学的研究

8,925 Views

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11:33 min

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January 19, 2018

DOI:

10.3791/56861-v

DOI:

10.3791/56861-v

•

11:33 min

January 19, 2018

•

2 Views

Mohammad Rashidi^1,2, Wyatt Vine¹, Jacob A.J. Burgess^3,4,5, Marco Taucer^1,2,6, Roshan Achal¹, Jason L. Pitters², Sebastian Loth^3,4, Robert A. Wolkow^1,2

¹Department of Physics,University of Alberta, ²National Institute for Nanotechnology,National Research Council of Canada, Edmonton, ³Max Planck Institute for the Structure and Dynamics of Matter, ⁴Max Planck Institute for Solid State Research, ⁵Department of Physics and Astronomy,University of Manitoba, ⁶Joint Attosecond Science Laboratory,University of Ottawa

Summary

我们演示了一种全电子的方法, 以观察纳秒分辨电荷动力学的掺杂原子在硅与扫描隧道显微镜。

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