Journal
/
神经科学
/
Odaklı İyon Işın Freze ve Beyin Dokusu Taramalı Elektron Mikroskobu
JoVE 杂志
神经科学
This content is Free Access.
JoVE 杂志 神经科学
Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue
Please note that all translations are automatically generated. Click here for the English version.

Odaklı İyon Işın Freze ve Beyin Dokusu Taramalı Elektron Mikroskobu

27,620 Views

•

08:57 min

•

July 06, 2011

DOI:

10.3791/2588-v

DOI:
10.3791/2588-v

•

08:57 min
July 06, 2011

•

3 Views
, ,
1Centre of interdisciplinary electron microscopy,École Polytechnique Fédérale de Lausanne

Summary

Automatically generated

Bu protokol, taramalı elektron mikroskobu, reçine gömülü beyin dokusu, odaklanmış iyon demeti üç boyutlu olarak hazırlanmış ve yansıması nasıl açıklamaktadır.

Explore More Videos

Focussed Ion Beam MillingScanning Electron MicroscopyFIB/SEM ProtocolAldehydes FixationHeavy Metal StainingOsmium TetroxideUranyl AcetateDehydrationResin InfiltrationUltramicrotomeGlass KnivesBlock PreparationVertical Face MillingBackscattered Electron ImagingSerial ImagingIsotropic VoxelsCell Ultrastructure Analysis

Read Article

Cite this Article

Knott, G., Rosset, S., Cantoni, M. Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue. J. Vis. Exp. (53), e2588, doi:10.3791/2588 (2011).

Download .ris file

Copy

Share Video

.

Copy