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Haz de iones enfocado fresado y microscopía electrónica de barrido en el tejido cerebral

JoVE 杂志
神经科学

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JoVE 杂志神经科学

Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue

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Haz de iones enfocado fresado y microscopía electrónica de barrido en el tejido cerebral

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08:57 min

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July 06, 2011

DOI:

DOI:

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08:57 min

July 06, 2011

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1 Views

Graham Knott, Stéphanie Rosset, Marco Cantoni

¹Centre of interdisciplinary electron microscopy,École Polytechnique Fédérale de Lausanne

Tags

Focussed Ion Beam Milling Scanning Electron Microscopy FIB/SEM Protocol Aldehydes Fixation Heavy Metal Staining Osmium Tetroxide Uranyl Acetate Dehydration Resin Infiltration Ultramicrotome Glass Knives Block Preparation Vertical Face Milling Backscattered Electron Imaging Serial Imaging Isotropic Voxels Cell Ultrastructure Analysis

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