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Serial Block-Face Scanning Electron Microscopy (SBEM) voor de studie van dendritische stekels
JoVE Journal
Neuroscience
Author Produced
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JoVE Journal Neuroscience
Serial Block-Face Scanning Electron Microscopy (SBEM) for the Study of Dendritic Spines

Serial Block-Face Scanning Electron Microscopy (SBEM) voor de studie van dendritische stekels

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11:16 min

October 02, 2021

DOI:

11:16 min
October 02, 2021

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Summary

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Serial Block-Face Scanning Electron Microscopy (SBEM) wordt toegepast op beeld en analyseren van dendritische stekels in de muriene hippocampus.

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