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इलेक्ट्रोन माइक्रोस्कोपी के माध्यम से पिकोमीटर-सटीक परमाणु स्थिति ट्रैकिंग

JoVE Journal
Chemistry
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JoVE Journal Chemistry

Picometer-Precision Atomic Position Tracking through Electron Microscopy

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इलेक्ट्रोन माइक्रोस्कोपी के माध्यम से पिकोमीटर-सटीक परमाणु स्थिति ट्रैकिंग

5,623 Views

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15:04 min

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July 03, 2021

DOI:

10.3791/62164-v

DOI:

10.3791/62164-v

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15:04 min

July 03, 2021

•

12 Views

Leixin Miao, Adrian Chmielewski, Debangshu Mukherjee, Nasim Alem

¹Department of Materials Science & Engineering,The Pennsylvania State University, ²Center for Nanophase Materials Sciences,Oak Ridge National Laboratory

Tags

Atomic Position Tracking Electron Microscopy Aberration Correction STEM Imaging Atomic Resolution Lattice Strain Defects Image Denoising Drift Correction Atom Column Quantification Overlapping Atoms MATLAB Application EasySTEM

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