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由 F 310 Nm 支队所示的阴离子光电子成像
JoVE Journal
Chemistry
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JoVE Journal Chemistry
Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F
DOI:

06:53 min

July 27, 2018

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Chapters

  • 00:04Title
  • 00:31Ion Generation
  • 01:03Ion Extraction, Separation and Detection
  • 01:56Photoelectron Production and Detection
  • 03:22Image Focusing and Collection
  • 04:22Results: Photoelectron Imaging of Anions
  • 05:50Conclusion

Summary

Automatic Translation

在这里, 我们提出了一个关于阴离子物种光电子成像的协议。利用速度映射光电子成像技术, 对真空中产生的阴离子和质谱分离, 提供了负离子和中性能级、负离子和中性结构以及负离子电子态性质的详细资料。

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