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Plasmatron में पंचमी विभक्ति सामग्री परीक्षण के दौरान उत्सर्जन स्पेक्ट्रोस्कोपी सीमा परत जांच
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JoVE Journal Engineering
Emission Spectroscopic Boundary Layer Investigation during Ablative Material Testing in Plasmatron
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Plasmatron में पंचमी विभक्ति सामग्री परीक्षण के दौरान उत्सर्जन स्पेक्ट्रोस्कोपी सीमा परत जांच

English

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11,975 Views

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09:41 min

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June 09, 2016

DOI:

10.3791/53742-v

DOI:
10.3791/53742-v

•

09:41 min
June 09, 2016

•

3 Views
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1Aeronautics and Aerospace Department,von Karman Institute for Fluid Dynamics, 2Research Group Electrochemical and Surface Engineering,Vrije Universiteit Brussel

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Helber, B., Chazot, O., Hubin, A., Magin, T. E. Emission Spectroscopic Boundary Layer Investigation during Ablative Material Testing in Plasmatron. J. Vis. Exp. (112), e53742, doi:10.3791/53742 (2016).

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